Advanced Digital Systems Test
(3-0-0-3)
CMPE Degree: This course is Not Applicable for the CMPE degree.
EE Degree: This course is Not Applicable for the EE degree.
Lab Hours: 0 supervised lab hours and 0 unsupervised lab hours.
Technical Interest Group(s) / Course Type(s): VLSI Systems and Digital Design
Course Coordinator:
Prerequisites: ECE 6140
Catalog Description
Design and test techniques for high-speed digital systems operating atrates above 100 MHz with a practical emphasis via substantial projects.
Course Outcomes
Not Applicable
Strategic Performance Indicators (SPIs)
Outcome 1 (Students will demonstrate expertise in a subfield of study chosen from the fields of electrical engineering or computer engineering):
1. Analyze and design transmission line structures to support multi-gigahertz bandwidth signals in high-speed testing environments.
Outcome 2 (Students will demonstrate the ability to identify and formulate advanced problems and apply knowledge of mathematics and science to solve those problems):
1. Utilize reflection diagrams to predict the time-domain response of sub-nanosecond logic transitions when encountering impedance discontinuities in test interfaces.
Outcome 3 (Students will demonstrate the ability to utilize current knowledge, technology, or techniques within their chosen subfield):
1. Design digital logic subsystems operating above 1 Gigabit-per-second.
Topical Outline
1. Introduction to High Speed Test
2. ECL Technology
3. Digital Testing Concepts
4. Emitter Coupled Logic
5. Electrical Interface to Automated Test Systems
6. Resistive Divider Probe
7. Testing High Speed CMOS, TTL, ECL Technologies
8. Time-domain Analysis of Transmission Line Structures
9. Printed Circuit Board (PCB) Design for High Speed Applications
10. Crosstalk and Other Sources of Signal Distortions
11. Power Distribution Techniques and Switching Noise
12. Thermal Management
13. Introduction to Gigahertz Digital Test
14. Test Program Development
15. Test Application and Debug