Tuesday, March 31, 2026 03:00PM
Title: Thermal Reliability with Oxygen Reservoir Layer and Atomic-Scale Insights in Fluorite Ferroelectrics for Memory-On-Logic Applications
Committee:
Dr. Asif Khan, ECE, Chair, Advisor
Dr. Shimeng Yu, ECE
Dr. Suman Datta, ECE
Dr. Josh Kacher, MSE
Dr. Andrea Padovani, Unimore