Location
Title: Reliability Characterization of Mixed-Signal Circuits: Integrated Voltage Regulators and Computing-in-Memory Systems
Committee:
Dr. Saibal Mukhopadhyay, ECE, Chair, Advisor
Dr. Visvesh Sathe, ECE
Dr. Shimeng Yu, ECE
Dr. Suman Datta, ECE
Dr. Celine Lin, CoC
