William H. Robinson, Ph.D., is a Professor in the School of Electrical and Computer Engineering at the Georgia Institute of Technology. An experienced academic leader, researcher, and educator, Dr. Robinson’s career includes higher education executive administration, large-scale applied research management, and externally funded research and technical innovation.
Prior to his current role, Dr. Robinson served as the Deputy Director for Research of the Information and Cyber Sciences Directorate (ICSD) at the Georgia Tech Research Institute (GTRI). At GTRI, he led strategic research operations across the Information and Communications Laboratory (ICL) and the Cybersecurity, Information Protection, and Hardware Evaluation Research Laboratory (CIPHER). He also served as the Interim Chief Technology Officer at GTRI. Before joining Georgia Tech, he spent nearly two decades at Vanderbilt University as a faculty member, which included service as Vice Provost for Academic Advancement and Associate Dean for Academic Success, while leading the Security and Fault Tolerance Research Group.
Dr. Robinson’s research contributions span national security and computer systems resilience, including: (1) radiation-hardened electronics for space and missile systems, (2) hardware trust and assurance for integrated circuits and third-party intellectual property, (3) cybersecurity and intrusion detection, and (4) resilient mobile ad-hoc networks. Dr. Robinson has also conducted quantitative and qualitative research focused on technical workforce development, institutional pathway creation, and career satisfaction in high-demand engineering and computing fields. His efforts examine the factors that influence doctoral persistence, faculty advancement, and long-term retention in science and engineering disciplines.
Dr. Robinson served as General Chair for the IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) in 2015 and 2016. He served as the Technical Program Chair for the 2024 IEEE Nuclear and Space Radiation Effects Conference (NSREC). He holds a B.S. in Electrical Engineering from Florida Agricultural and Mechanical University (FAMU), as well as an M.S. in Electrical Engineering and a Ph.D. in Electrical and Computer Engineering from Georgia Tech.
- Ph.D., Electrical and Computer Engineering, Georgia Institute of Technology
- M.S., Electrical Engineering, Georgia Institute of Technology
- B.S., Electrical Engineering, Florida Agricultural and Mechanical University (FAMU)
- Cybersecurity and Hardware Security
- Computer Systems and Fault Tolerance
- Radiation Effects in Microelectronics
- Technical Workforce Development and STEM Pathway Creation
- NSF CAREER Award – 2008
- DARPA Computer Science Study Panel – 2008
- Florida A & M University Outstanding Alumni of the Quasquicentennial Award - 2012
- General Chair of IEEE International Symposium on Hardware Oriented Security and Trust (HOST) – 2015 and 2016
- Full Membership in Sigma Xi, The Scientific Research Honor Society – 2020
- Inducted into the Hardee County (FL) Hall of Fame – 2021
- Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization, D Black, WH Robinson, IZ Wilcox, DB Limbrick, JD Black, IEEE Transactions on Nuclear Science 62 (4), 1540-1549
- Securing commercial WiFi-based UAVs from common security attacks, M Hooper, Y Tian, R Zhou, B Cao, AP Lauf, L Watkins, WH Robinson, ..., MILCOM 2016-2016 IEEE Military Communications Conference, 1213-1218
- Reliability-aware synthesis of combinational logic with minimal performance penalty, DB Limbrick, NN Mahatme, WH Robinson, BL Bhuva, Nuclear Science, IEEE Transactions on 60 (4), 2776 - 2781
- Using benchmarks for radiation testing of microprocessors and FPGAs, H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ..., IEEE transactions on nuclear science 62 (6), 2547-2554
- Fault simulation and emulation tools to augment radiation-hardness assurance testing, HM Quinn, DA Black, WH Robinson, SP Buchner, IEEE Transactions on Nuclear Science 60 (3), 2119-2142